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Editor : Publications de l'Université de Saint-Etienne
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Books :
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The book series is addressed to the researchers, engineers and technicians in the field of material science (chemistry and physics),
ground science (mineralogy and geology) and biology, to whom transmission electron microscopy analysis of materials is being used
to understand both structural characteristics and the properties and specific functions brought by material conformation.
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- Summary of volume 1 : Methodology
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The first volume covers theoretical and practical aspects of sample preparation for TEM. It brings you tools for preparation and observation techniques.
This volume also gives directions to the best preparative technique to implement by taking into account material types, material structures and their properties.
Physical properties, material classification and microstructures are also compiled, alongside a thorough description of physics and chemistry of sample
preparation techniques. This technical handbook identifies the main artefacts brought by the preparation techniques (mechanical, physical and chemical techniques).
It covers a wide range of TEM analysis and observation modes and gives a comprehensive comparison between techniques used on the same material and offers tools
to implement a particular technique onto a given material. A thoughtful discussion upon combination of techniques is also included to guide your complex
sample analysis and to obtain TEM thin slice.
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- Plan of volume I : Methodology
CHAPITRE 1 : INTRODUCTION TO MATERIALS
1.1. Introduction
1.2. Classification of materials and properties
1.3. Microstructures in materials science
1.4. Microstructures in biology
CHAPITRE 2 : DIFFERENT OBSERVATION MODES IN ELECTRON TRANSMISSION MICROSCOPY (SEM, TEM and STEM)
2.1. Introduction
2.2. Signals used in electron transmission microscopy
2.3. Microscopes and observation modes
2.4. Différents types of electron microscopes (SEM, TEM, STEM)
2.5. Différents observation techniques in TEM
2.6. Conclusion and information assessment
CHAPITRE 3 : MATERIAL STUDY APPROACH AND TEM /TEM ANALYSES
3.1. Introduction
3.2. Preliminary techniques to TEM analysis
3.3. Approach to start the study of materials
3.4. Choice of TEM analysis
3.5. Topography analysis
3.6. Structural analysis
3.7. Crystallographic analysis
3.8. Crystal defect analysis: 1D (dislocations), 2D (grain boundaries, interfaces) and 3D (précipitates)
3.9. EDS chemical analyses and EELS spectroscopic analyses
3.10. Structural analyses in particular conditions
3.11. Physical property studies
3.12. Relation between sample thickness with the type of TEM and TEM/STEM analyses
3.13. Assessment of TEM analyses.
CHAPITRE 4 : PHYSICAL AND CHEMICAL MECHANISMS IN PREPARATION TECHNIQUES
4.1. Introduction
4.2. Mechanical action
4.3. Chemical action
4.4. Ionic action
4.5. Action leading to a material physical state change.
4.6. Action leading to material properties change
4.7. Action leading to a physical or chemical deposit
CHAPITRE 5 : ARTEFACTS IN ELECTRON TRANSMISSION MICROSCOPY
5.1. Introduction
5.2. Artefacts induced by the sample preparation
5.3. Artefacts induced by TEM observations.
5.4. Examples of artefacts
5.5. Recapitulative tables
5.6. Conclusion
CHAPITRE 6 : CHOICE OF THE SAMPLE PREPARATION DEPENDING ON THE MATERIAL STUDY AND TEM ANALYSIS
6.1. Introduction
6.2. Classification of sample preparation techniques
6.3. Characteristics of sample preparation techniques
6.4. Criteria used for the sample preparation technique choice
6.5. Choice criteria as a function of material type
6.6. Choice criteria as a function of material organisation
6.7. Choice criteria as a function of material properties
6.8. Choice criteria related to TEM analysis type
6.9. Choice of the thin foil orientation in the microscope
6.10. Choice criteria related to artefacts induced by the sample préparation
6.11. Adaptations of the technique related to problems during TEM observations
6.12. Conclusion
CHAPITRE 7 . COMPARATIVE EXAMPLES BETWEEN TECHNIQUE IN MATERIAL SCIENCE AND BIOLOGY
7.1. Intoduction
7.2. Examples on divided or single particule materials
7.3. Examples on bulk, thin film and multilayered materials
CHAPITRE 8 : CONCLUSION
8.1. What is a good TEM sample ?
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- Summary of volume 2 : Techniques
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The second volume is dedicated to technical hints. 14 different preparation techniques are developed; compatibility and pre-treatments are also included.
This volume also compiles 22 thin slice preparation detailed protocols for TEM analysis. It considers theoretical sidelight, experimental conditions and guidelines,
options and variations, advantages and constraints, common artefacts brought by the given treatment of sample. Application fields of main techniques are
developed with particular considerations on type of materials, conditioning, compatible analysis of a given preparation and the risks of the techniques.
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- Plan of volume II : Techniques
CHAPTER 1 : INTRODUCTION
CHAPTER 2 : INITIAL SAMPLE PREPARATION TECHNIQUES
2.1. Wheel or wire sawing
2.2. Ultrasonic grinding
2.3. Mechanical polishing
2.4. Dimpling
2.5. Electropolishing
2.6. Chemical polishing
2.7. Sandwich
2.8. Embedding
2.9. Substitution-impregnation-embedding at room temperature
2.10. Substitution-impregnation-embedding in cryogenic mode
2.11. Chemical fixing
2.12. Physical fixing :cryo-fixing
2.13. Continuous support films
2.14. Perforated support films
CHAPTER 3 : THINNING PREPARATION TECHNIQUES
3.1. Twin jet electrolytic
3.2. Full bath electrolytic
3.3. Twin jet chemical
3.4. Full bath chemical
3.5. Ion beam thinning
3.6. Focused ion beam thinning (FIB)
CHAPTER 4 : MECHANICAL PREPARATION TECHNIQUES
4.1. Grinding
4.2. Wedge cleavage
4.3. Tripod polishing
4.4. Ultramicrotomy
4.5. Cryo-ultramicrotomy
CHAPTER 5 : REPLICA PREPARATION TECHNIQUES
5.1. Direct replica
5.2. Indirect replica
5.3. Extraction replica
5.4. Freeze-fracture
CHAPTER 6 : SPECIFIC PREPARATION TECHNIQUES FOR ULTRAFINE MATERIALS
6.1. Dispersion of powdered materials
6.2. Film of frozen suspension
CHAPTER 7 : CONTRAST ENHANCEMENT AND LABELLING PREPARATION TECHNIQUES
7.1. Decoration shadowing
7.2. Contrast by « negative staining »
7.3. Contrast by « positive staining »
7.4. Immunolabelling
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To buy our books, clic HERE.
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The two volumes are dependent and complementary with the TEMsamprep site
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